Biographical Information:

Sule Ozev received her B.S. degree in Electrical Engineering from Bogazici University, Turkey, and her M.S. and Ph.D. degrees in Computer Science and Engineering from University of California, San Diego in 1995, 1998, and 2002 respectively. Dr. Ozev is an assistant professor at the Electrical and Computer Engineering Department at Duke University. She serves on the program committees of Design Automation and Test in (DATE'03) Conference, The Symposium on Photonics, Networking and Computing (2003), and the North Atlantic Test Workshop (2003). Her research interests include system-level test methods for mixed-signal and RF circuits, computer-aided-analysis of high-level and transistor-level circuits, and device modeling.

Research Interests:

Mixed-signal circuit testing: System-level test methods for mixed-signal circuits.
Hierarchical tolerance analysis: Tolerance analysis for yield estimation, circuit testing, and automated analog circuit synthesis. RF Testing: New RF test methods for integrated transceivers.
Computer-aided design for analog circuits: Automated analog circuit synthesis, and analysis.

Related Links
www.ee.duke.edu/~sule